Please use this identifier to cite or link to this item:
https://rda.sliit.lk/handle/123456789/2193
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Krishnapillai, L | - |
dc.contributor.author | Veluppillai, S | - |
dc.contributor.author | Akilan, A | - |
dc.contributor.author | Saumika, V. N | - |
dc.contributor.author | De Silva, K. P | - |
dc.contributor.author | Gamage, M. P. A. W | - |
dc.date.accessioned | 2022-05-03T09:58:53Z | - |
dc.date.available | 2022-05-03T09:58:53Z | - |
dc.date.issued | 2021 | - |
dc.identifier.citation | Krishnapillai, L., Veluppillai, S., Akilan, A., Saumika, V.N., De Silva, K.P.D.H., Gamage, M.P.A.W. (2021). Smart Attendance and Progress Management System. In: Mekhilef, S., Favorskaya, M., Pandey, R.K., Shaw, R.N. (eds) Innovations in Electrical and Electronic Engineering. Lecture Notes in Electrical Engineering, vol 756. Springer, Singapore. https://doi.org/10.1007/978-981-16-0749-3_60 | en_US |
dc.identifier.isbn | 978-981-16-0749-3 | - |
dc.identifier.uri | http://rda.sliit.lk/handle/123456789/2193 | - |
dc.description.abstract | Management of attendance may be a great burden on lecturers if done manually. This study focuses on finding an automated solution for taking attendance and keeping track of progress of a student in a smart way. The smart attendance system is generally using biometrics for identifying individuals. In this study, face recognition was considered for identification. The student's face is recognized and attendance is taken using face biometrics based on high-definition monitor camera. The images of the student are given as an input and image classification was done using CNN algorithm preventing duplicate entries for attendance. For tracking the progress of the student, the factors affecting the GPA are trained using Machine Learning algorithms. This research also aims to examine the effective progress of undergraduate students by taking past year records and find out the factors for their high and low output which will be helpful to improve their performance. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Springer, Singapore | en_US |
dc.relation.ispartofseries | Innovations in Electrical and Electronic Engineering;Pages 771-785 | - |
dc.subject | Smart attendance | en_US |
dc.subject | Machine Learning | en_US |
dc.subject | Convolutional Neural Networks | en_US |
dc.subject | Face recognition | en_US |
dc.title | Smart Attendance and Progress Management System | en_US |
dc.type | Article | en_US |
dc.identifier.doi | doi.org/10.1007/978-981-16-0749-3_60 | en_US |
Appears in Collections: | Department of Information Technology-Scopes Research Papers - SLIIT Staff Publications |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
502267_1_En_Print.indd.pdf Until 2050-12-31 | 1.04 MB | Adobe PDF | View/Open Request a copy |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.