Please use this identifier to cite or link to this item: https://rda.sliit.lk/handle/123456789/2137
Title: Plagiarism Detection Tool for Enhanced Entity-Relationship Diagrams
Authors: Dahanayake, H
Samarajeewa, D
Jayathilake, A
Bandara, D
Karunasena, A
Weerasinghe, L
Keywords: Plagiarism Detection
Detection Tool
Enhanced
Entity-Relationship Diagrams
Issue Date: 1-Dec-2021
Publisher: IEEE
Citation: H. Dahanayake, D. Samarajeewa, A. Jayathilake, D. Bandara, A. Karunasena and L. Weerasinghe, "Plagiarism Detection Tool for Enhanced Entity-Relationship Diagrams," 2021 IEEE 12th Annual Ubiquitous Computing, Electronics & Mobile Communication Conference (UEMCON), 2021, pp. 0598-0606, doi: 10.1109/UEMCON53757.2021.9666552.
Series/Report no.: 2021 IEEE 12th Annual Ubiquitous Computing, Electronics & Mobile Communication Conference (UEMCON);Pages 0598-0606
Abstract: Plagiarism is presenting someone else’s work as one’s own work without giving credit to the original owner. Recently, plagiarism has become a serious issue in the fields of Education and Technology. To address this issue, many systems have been implemented to detect plagiarism. However, most of them are designed to deal with plagiarism of text content. Detecting plagiarism in figures and diagrams is equally important. Although there is research done on detecting plagiarism in images and flow charts, there is no research done on detecting plagiarism in more complex diagrams such as Enhanced Entity-Relationship (EER) diagrams. This paper presents a methodology to detect plagiarism in EER diagrams using Deep Neural Networks (DNN), image processing techniques, Optical Character Recognition (OCR) techniques, and text similarity detection algorithms. Since the students are aware of the existence of a plagiarism detecting tool, it will encourage the students to do work on their own and it will reduce exam offenses. The similarity report can be presented as proof to the offenders who are not accepting that they have plagiarized others' work. Using the proposed system, the EER diagram plagiarism can be detected much faster and accurately. Therefore, the efficiency of marking examinations will be increased. The final outcome of the system will be a similarity report including the plagiarized content in the compared EER diagrams.
URI: http://rda.sliit.lk/handle/123456789/2137
ISBN: 978-1-6654-0690-1
Appears in Collections:Department of Information Technology-Scopes
Research Papers - IEEE
Research Papers - SLIIT Staff Publications
Research Publications -Dept of Information Technology

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